Wang L. T. <br/><br/>
VLSI test principles and architectures  Design for testability 

 -  Elsevier  2020 
<br/><br/><label>ISBN: </label>9780123705976 
<br/><br/><label>Subjects--Topical Terms: </label><br/>ETC_ELECTRONICS
<br/><br/><label>Dewey Class. No.: </label>621.395