Bushnell M. L. <br/><br/>
Essentials of electronic testing for digital memory and mixed signl vlsi circuits 

 - New York  Springer  2006 
 - xviii, 690p. 
<br/><br/><label>ISBN: </label>9780306470400 
<br/><br/><label>Subjects--Topical Terms: </label><br/>ETC
<br/><br/><label>Dewey Class. No.: </label>621.395