| 000 | 00423nam a2200181Ia 4500 | ||
|---|---|---|---|
| 008 | 240220s9999 xx 000 0 und d | ||
| 020 | _a9780123705976 | ||
| 041 | _aENG | ||
| 082 | _a621.395 | ||
| 100 | _aWang L. T. | ||
| 245 | 0 | _aVLSI test principles and architectures | |
| 245 | 0 | _bDesign for testability | |
| 260 | _bElsevier | ||
| 260 | _c2020 | ||
| 365 | _b2030.2 | ||
| 650 | _aETC_ELECTRONICS | ||
| 942 | _cEB | ||
| 999 |
_c12862 _d12862 |
||