000 00429nam a2200193Ia 4500
008 240326s9999 xx 000 0 und d
020 _a9783031797842
041 _aENG
082 _a621.395
100 _aLala P. K.
245 0 _aAn introduction to logic circuit testing
260 _aNew York
260 _bSpringer
260 _c2022
300 _a"x, 1 to 99p."
365 _b2656
650 _aETC
942 _cDBK
999 _c36032
_d36032