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008 240820b |||||||| |||| 00| 0 eng d
020 _a9780306470400
040 _cSpringer
041 _aEnglish
082 _a621.395
100 _aBushnell M. L.
245 _aEssentials of electronic testing for digital memory and mixed signl vlsi circuits
260 _aNew York
_bSpringer
_c2006
300 _axviii, 690p.
365 _b908
650 _aETC
700 _aAgrawal Vishwani D.
942 _2ddc
_cEB
_n0
999 _c36245
_d36245